Measurement techniques for thin films

Edited by Bertram Schwartz and Newton Schwartz.

New York : Electronics Division and Dielectrics and Insulation Division, Electrochemical Society, [1967]

vi, 364 págs. : ilustraciones ; 21 cm.

Consists of most of the papers presented at two symposia: a symposium held in Buffalo, N.Y., Oct. 11, 1965, and sponsored by the Electronics Division of the Electrochemical Society; and a symposium held in Philadelphia Oct. 10-11, 1966, and sponsored jointly by the Electronics Division and the Dielectrics and Insulation Division of the Electrochemical Society.